Atomic force microscope (AFM)
Surface profile and magnetic structure are measured.
Specifications
Dimeinsion3100+Nanoscope IV by Bruker
Measurement modes: AFM（contact，tapping，non-contact）, STM，MFM，EFM，LFM
Surface potential image，Current image，Lithography
Scan range : 90μm in XY，6μm in Z
Sample size : Max. 150 mmφ x 12 mmt
Soundproofing hood